Reciprocal space mapping by spot profile analyzing low energy electron diffraction
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1988287
Reference16 articles.
1. Diffraction of Electrons by a Crystal of Nickel
2. A New Type of Apparatus for Experiments in Secondary Electron Diffraction
3. Adsorbate induced mesoscopic surface reconstruction of the system Te/Pd(102)
4. High temperature self-assembly of Ag nanowires on vicinal Si(001)
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