Low‐frequency noise behavior of γ‐irradiated partially depleted silicon‐on‐insulatorn‐channel metal‐oxide‐semiconductor transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.110733
Reference13 articles.
1. Modes of operation and radiation sensitivity of ultrathin SOI transistors
2. Effect of X-ray radiation on MOSFET's (SIMOX) LF excess noise
3. Radiation hardness assurance of space electronics
4. Kink-related noise overshoot in SOI n-MOSFETS operating at 4.2 K
5. A study of the kink‐related excess low‐frequency noise in silicon‐ on‐insulatorn‐metal‐oxide‐semiconductor transistors operated at liquid helium temperatures
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1. Impact of channel carrier displacement and barrier height lowering on the low-frequency noise characteristics of surface-channel n-MOSFETs;Solid-State Electronics;2005-04
2. Radiation Effects and Low-Frequency Noise in Silicon Technologies;Low Temperature Electronics;2001
3. The low-frequency noise behaviour of silicon-on-insulator technologies;Solid-State Electronics;1996-07
4. Low-frequency noise characterisation of γ-irradiated silicon-on-insulator MOSFETs;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-01
5. Empirical relationship between the low‐frequency noise spectral density and the transconductance of silicon‐on‐insulatorn‐channel metal‐oxide‐semiconductor transistors;Applied Physics Letters;1994-10-10
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