1. Experimental investigation of thez2scaling law of fast-ion-produced secondary-electron emission;Physical Review A;1991-02-01
2. A charged‐particle analyzer for radio‐frequency discharges;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1989-11
3. Wafer Cooling, Faraday Design and Wafer Charging;Ion Implantation Science and Technology;1988
4. A method of surface charge neutralization during ion implantation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-01
5. Neutral particles in the beam of a single ended van de graaff accelerator;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1986-02