Dual energy-band excitation from a low power Rh anode X-ray tube for the simultaneous determination of low Z and high Z elements (Na-U) using total-reflection X-ray fluorescence analysis (TXRF)
Author:
Affiliation:
1. Atominstitut, TU Wien, Stadionallee 2, 1020 Vienna, Austria
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5044527
Reference13 articles.
1. Analysis of low Z elements in various environmental samples with total reflection X-ray fluorescence (TXRF) spectrometry
2. Synchrotron radiation induced TXRF
3. Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II
4. Total reflection X-ray fluorescence measurements of S and P in proteins using a vacuum chamber specially designed for low Z elements
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1. Implementing light elements detection and quantification in aluminosilicate materials using a Low-Z total-reflection X-ray fluorescence spectrometer;Applied Clay Science;2024-04
2. Geographical Discrimination of Pu-Erh Tea by the Determination of Elements by Low-Power Total Reflection X-Ray Fluorescence (TXRF) and Caffeine and Polyphenols by Spectrophotometry;Analytical Letters;2022-06-27
3. Isolation Strategy towards Earth-Abundant Single-Site Co-Catalysts for Photocatalytic Hydrogen Evolution Reaction;Catalysts;2021-03-25
4. A fast method for the chemical analysis of clays by total-reflection x-ray fluorescence spectroscopy (TXRF);Applied Clay Science;2019-11
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