Si/SiO2etch properties using CF4and CHF3in radio frequency cylindrical magnetron discharges
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.103322
Reference17 articles.
1. Electron cyclotron resonance microwave discharges for etching and thin‐film deposition
2. Plasma characterization of an electron cyclotron resonance–radio‐frequency hybrid plasma reactor
3. The Roles of Ions and Neutral Active Species in Microwave Plasma Etching
4. A 26‐cm electron‐cyclotron‐resonance ion source for reactive ion beam etching of SiO2 and Si
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