Composition profiles at initial stage of altered layer formation on Cu‐Pt alloy surfaces under Ar+ion bombardment
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358636
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1. Quantitative Compositional Depth Profiling;Springer Series in Surface Sciences;2012-06-01
2. Surface composition analysis by low-energy ion scattering;Surface Science Reports;2007-03-01
3. Sputter-depth profiling for thin-film analysis;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;2003-11-25
4. Thermal electrochemical, and plasma oxidation of Ti-50Zr, Cu-50Zr, Cn-50Ti, and Cu-33Ti-33Zr alloys;Oxidation of Metals;2001
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