Interfacial properties of single-crystalline CeO2 high-k gate dielectrics directly grown on Si (111)
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1526169
Reference6 articles.
1. Crystalline Oxides on Silicon: The First Five Monolayers
2. Physical Structure and Inversion Charge at a Semiconductor Interface with a Crystalline Oxide
3. Electrical Properties of Single Crystalline CeO2High-k Gate Dielectrics Directly Grown on Si (111)
4. Epitaxial growth of CeO2layers on silicon
5. The electronic structure of stoichiometric and reduced CeO2 surfaces: an XPS, UPS and HREELS study
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