Concurrent measurement of adhesive and elastic surface properties with a new modulation technique for scanning force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1150689
Reference18 articles.
1. Rastersondenmikroskopie: Rastersondenverfahren in der industriellen Praxis: Eine Übersicht der Charakterisierungsmöglichkeiten aus der Anwendersicht
2. From molecules to cells: imaging soft samples with the atomic force microscope
3. Using force modulation to image surface elasticities with the atomic force microscope
4. Imaging viscoelasticity by force modulation with the atomic force microscope
5. Localized surface elasticity measurements using an atomic force microscope
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