Using force modulation to image surface elasticities with the atomic force microscope-Reference-Cited by-同舟云学术

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Using force modulation to image surface elasticities with the atomic force microscope

Published:1991-04-01 Issue:2 Volume:2 Page:103-106
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Maivald P,Butt H J,Gould S A C,Prater C B,Drake B,Gurley J A,Elings V B,Hansma P K

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/2/i=2/a=004/pdf

Reference21 articles.

1. Atomic Force Microscope

2. Scanned-Probe Microscopes

3. Atomic force microscopy using optical interferometry

4. Novel optical approach to atomic force microscopy

5. An atomic‐resolution atomic‐force microscope implemented using an optical lever

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