Defect dominated charge transport in amorphous Ta2O5 thin films-Reference-Cited by-同舟云学术

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Defect dominated charge transport in amorphous Ta2O5 thin films

Published:2000-07-15 Issue:2 Volume:88 Page:850-862
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Fleming R. M.,Lang D. V.,Jones C. D. W.,Steigerwald M. L.,Murphy D. W.,Alers G. B.,Wong Y.-H.,van Dover R. B.,Kwo J. R.,Sergent A. M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.373747

Reference40 articles.

1. Tantalum pentoxide (Ta2O5) thin films for advanced dielectric applications

2. Electroluminescence and Photoresponse of Ta[sub 2]O[sub 5] and TiO[sub 2] Diodes

3. Defect photoconductivity of anodic Ta2O5films

4. Photoconductivity in anodic Ta2O5 formed on nitrogen‐doped tantalum films

5. uv‐stimulated photocurrent spectroscopy and trapping kinetics of a 2.1‐eV trap in anodic Ta2O5 films

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4. Low mechanical loss and high refractive index in amorphous Ta2O5 films grown by magnetron sputtering;Physical Review Materials;2024-03-06

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