Numerical analysis of x‐ray reflectivity data from organic thin films at interfaces
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.471492
Reference8 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. Inverse problems in neutron and x-ray reflectivity studies
3. Analysis of neutron and X-ray reflectivity data. I. Theory
4. Analysis of neutron and X-ray reflectivity data. II. Constrained least-squares methods
5. Surface Study of Langmuir-Blodgett Films by Electron Microscopy and X-Ray Reflectivity
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