Thermal conductivity and diffusivity measurements in the sub‐μm and sub‐μs scale on centimeter area samples using a microthermocouple-Reference-Cited by-同舟云学术

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Thermal conductivity and diffusivity measurements in the sub‐μm and sub‐μs scale on centimeter area samples using a microthermocouple

Published:1996-12 Issue:12 Volume:67 Page:4246-4255
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Forster R.,Gmelin E.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1147576

Reference27 articles.

1. Thermal conductivity of thin SiO2 films

2. Thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry

3. Measurement of thermal diffusivity of small, high conductivity samples using a phase sensitive technique

4. Thermal conductivity of thin films: Measurements and understanding

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