Author:
Brotzen F.R.,Loos P.J.,Brady D.P.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference9 articles.
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3. IEEE Proc. Int. Reliab. Phys. Symp.;Black,1982
4. Standard guide for design of straight-line test structures for detecting metallization open-circuit or resistance-increase failure due to electromigration,1989
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91 articles.
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