Local thickness determination of thin insulator films via localized states
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4883219
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1. Thickness of Spin-Cast Polymer Thin Films Determined by Angle-Resolved XPS and AFM Tip-Scratch Methods
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3. Graphene Thickness Determination Using Reflection and Contrast Spectroscopy
4. Thickness determination of thin polycrystalline film by grazing incidence X-ray diffraction
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