Structural and electrical characterization of AuPtAlTi Ohmic contacts to AlGaN∕GaN with varying annealing temperature and Al content-Reference-Cited by-同舟云学术

Structural and electrical characterization of AuPtAlTi Ohmic contacts to AlGaN∕GaN with varying annealing temperature and Al content

Published:2008-04 Issue:7 Volume:103 Page:074501
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Fay M. W.,Han Y.,Brown P. D.,Harrison I.,Hilton K. P.,Munday A.,Wallis D.,Balmer R. S.,Uren M. J.,Martin T.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2890978

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