A cross-sectional atomic force microscopy study of nanocrystalline Ge precipitates in SiO2 formed from metastable Si1−xGexO2
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.365962
Reference21 articles.
1. Visible photoluminescence from nanocrystallite Ge embedded in a glassySiO2matrix: Evidence in support of the quantum-confinement mechanism
2. Correlation of Size and Photoluminescence for Ge Nanocrystals in SiO2 Matrices
3. Visible Photoluminescence from Si Microcrystals Embedded in SiO2Glass Films
4. Ion Beam Synthesis of Luminescent Si and Ge Nanocrystals in a Silicon Dioxide Matrix
5. Growth of Ge, Si, and SiGe nanocrystals in SiO2matrices
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