A Device to Deposit Automatically the Proper Thickness of Metals Used in Shadow‐Casting in Electron Microscopy
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Published:1949-07
Issue:7
Volume:20
Page:527-529
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Bishop Francis W.
Cited by
3 articles.
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1. Thickness Measurements;Physics of Nonmetallic Thin Films;1976
2. A Tracer Method for the Thickness Measurement of Thin Bi Films;Review of Scientific Instruments;1952-08
3. Electron Microscopy;Analytical Chemistry;1950-01-18