Confocal scanning optical microscopy of BaxSr1−xTiO3 thin films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.120335
Reference17 articles.
1. Microwave measurement of the dielectric constant of Sr0.5Ba0.5TiO3ferroelectric thin films
2. SrxBa(1−x)TiO3 thin films for active microwave device applications
3. The effect of annealing on the structure and dielectric properties of BaxSr1−xTiO3 ferroelectric thin films
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