Charge stabilization of shallow nitrogen-vacancy centers using graphene/diamond junctions

Author:

Haruyama Moriyoshi1ORCID,Okigawa Yuki2ORCID,Okada Mitsuhiro2ORCID,Nakajima Hideaki2ORCID,Okazaki Toshiya2ORCID,Kato Hiromitsu1ORCID,Makino Toshiharu1ORCID,Yamada Takatoshi2ORCID

Affiliation:

1. Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology 1 , 1-1-1 Umezono, Tsukuba, Ibaraki 305–8568, Japan

2. Nano Carbon Device Research Center, National Institute of Advanced Industrial Science and Technology 2 , 1-1-1 Higashi, Tsukuba, Ibaraki 305–8565, Japan

Abstract

We studied the charge-state stabilization of shallow nitrogen-vacancy (NV) centers in (111) diamond using graphene/diamond junctions. Measurement of the fluorescence stability and evaluation of the charge-state stability were conducted on the NV centers at the graphene and the graphene-free region. The results revealed that about half of the total NV centers (NV0 + NV−) at the graphene-free region were unstable, while over 90% of the measured NV centers at the graphene region were stabilized as NV− centers. Graphene/diamond junctions contribute significantly to charge-state stabilization of shallow NV− centers in (111) diamond.

Funder

MEXT Quantum Leap Flagship Program

JSPS KAKENHI

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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