Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies-Reference-Cited by-同舟云学术

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Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies

Published:2014-06-09 Issue:23 Volume:104 Page:232901
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Eliseev Eugene A.¹,Morozovska Anna N.²,Ievlev Anton V.³,Balke Nina³,Maksymovych Peter³,Tselev Alexander³,Kalinin Sergei V.³

Affiliation:

1. Institute for Problems of Materials Science, NAS of Ukraine, Krjijanovskogo 3, 03142 Kiev, Ukraine

2. Institute of Physics, NAS of Ukraine, 46 pr. Nauki, 03028 Kiev, Ukraine

3. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37922, USA

Funder

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4882861

Reference42 articles.

1. Local polarization dynamics in ferroelectric materials

2. Nanoscale ferroelectrics: processing, characterization and future trends

3. Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

4. Nanoscale mapping of ion diffusion in a lithium-ion battery cathode

5. Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution

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