Evidence for disorder‐induced vibrational mode coupling in thin amorphous SiO2films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.344472
Reference14 articles.
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4. A Review of infrared spectroscopic studies of vapor-deposited dielectric glass films on silicon
5. High-Resolution X-Ray Photoelectron Spectroscopy as a Probe of Local Atomic Structure: Application to Amorphous SiO2and the Si-SiO2Interface
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