An investigation of the Young's modulus of single-crystalline wurtzite indium nitride using an atomic force microscopy based micromechanical bending test-Reference-Cited by-同舟云学术

An investigation of the Young's modulus of single-crystalline wurtzite indium nitride using an atomic force microscopy based micromechanical bending test

Published:2012-11-26 Issue:22 Volume:101 Page:221906
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lu Yen-Sheng,Hsieh Chih-Hung,Gwo Shangjr,Hou Max T.,Yao Jung-Sheng,Yeh J. Andrew

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4763459

Reference23 articles.

1. Unusual properties of the fundamental band gap of InN

2. When group-III nitrides go infrared: New properties and perspectives

3. Optical and electrical properties of InN grown by radio-frequency reactive sputtering

4. Absorption and Emission of Hexagonal InN. Evidence of Narrow Fundamental Band Gap

5. Indium nitride (InN): A review on growth, characterization, and properties

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