Sheath collision processes controlling the energy and directionality of surface bombardment in O2reactive ion etching
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.341947
Reference25 articles.
1. Ion‐ and electron‐assisted gas‐surface chemistry—An important effect in plasma etching
2. Etching of SiO2 and Si in a He-F2 plasma
3. Plasma Etch Anisotropy—Theory and Some Verifying Experiments Relating Ion Transport, Ion Energy, and Etch Profiles
4. Ion bombardment energy distributions in radio‐frequency glow‐discharge systems
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