Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions

Published:2009-02-09 Issue:6 Volume:94 Page:063502
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Murray Conal E.,Ren Z.,Ying A.,Polvino S. M.,Noyan I. C.,Cai Z.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3079656

Reference12 articles.

1. Fabrication and analysis of deep submicron strained-Si n-MOSFET's

2. Effect of mechanical stress induced by etch-stop nitride: impact on deep-submicron transistor performance

3. A Logic Nanotechnology Featuring Strained-Silicon

4. n-MOSFET With Silicon–Carbon Source/Drain for Enhancement of Carrier Transport

5. Process‐induced mechanical stress in isolation structures studied by micro‐Raman spectroscopy

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Strain distributions in carbon-doped silicon nanowires along [110] and [100] investigated by X-ray diffraction;Japanese Journal of Applied Physics;2023-12-18

2. Mapping of the mechanical response in Si/SiGe nanosheet device geometries;Communications Engineering;2022-06-10

3. Review on applications of synchrotron‐based X‐ray techniques in materials characterization;X-Ray Spectrometry;2020-03

4. References;X-ray Microscopy;2019-11-30

5. Appendix A X-Ray Data Tabulations;X-ray Microscopy;2019-11-30

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP