Submicron-scale characterization of poly-Si thin films crystallized by excimer laser and continuous-wave laser
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1751635
Reference19 articles.
1. XeCl Excimer laser annealing used in the fabrication of poly-Si TFT's
2. Phase transformation mechanisms involved in excimer laser crystallization of amorphous silicon films
3. Observation of Defects in Laser-Crystallized Polysilicon Thin Films by Hydrogenation and Raman Spectroscopy
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