Determination of deep trapping lifetime in organic semiconductors using impedance spectroscopy
Author:
Affiliation:
1. Department of Physics and Electronics, Osaka Prefecture University, 1-1 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8531, Japan
Funder
Japan Society for the Promotion of Science (JSPS)
Ministry of Education, Culture, Sports, Science, and Technology (MEXT)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
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