A simple and reliable method of thermoelectic effect spectroscopy for semi‐insulating III‐V semiconductors
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1142398
Reference10 articles.
1. Study of defects in LEC-grown undoped SI-GaAs by thermally stimulated current spectroscopy
2. Transient photoconductivity measurements in semi‐insulating GaAs. I. An analog approach
3. Thermoelectric effect spectroscopy of deep levels—application to semi‐insulating GaAs
4. Hole traps in bulk and epitaxial GaAs crystals
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