Author:
Park Y. S.,Grant J. T.,Haas T. W.
Subject
General Physics and Astronomy
Cited by
12 articles.
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1. Effective combinations of features in predicting the range of incident ions using machine learning;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-08
2. Surface Science Aspects of Contamination in Tem Sample Preparation;MRS Proceedings;1997
3. MeV S Implantation into GaAs;Journal of The Electrochemical Society;1988-05-01
4. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986
5. XPS study of ion-implanted arsenic in a-Si(H);Solar Energy Materials;1984-12