Critical volume fraction of crystallinity for conductivity percolation in phosphorus‐doped Si:F:H alloys
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.93133
Reference4 articles.
1. Electroreflectance and Raman scattering investigation of glow-discharge amorphous Si:F:H
2. Critical Density in Percolation Processes
3. Infrared and Raman spectra of the silicon-hydrogen bonds in amorphous silicon prepared by glow discharge and sputtering
4. Evidence of Voids Within the As-Deposited Structure of Glassy Silicon
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