Deep center characterization by optically‐controlled paramagnetic resonance in AgGaS2
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.329446
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1. Characterization of deep levels in CdTe by photo-EPR and related techniques;Journal of Crystal Growth;1990-04
2. Some Advanced Microwave Techniques for the Investigation of Defect States in Semiconductors;Physica Scripta;1989-01-01
3. Photo-EPR and DLTS of CdTe: CO;Journal of Crystal Growth;1988-01
4. Electronic Structure of 3d Transition-Atom Impurities in Semiconductors;Solid State Physics;1986
5. On the application of the photo-EPR technique to the studies of photoionization, DAP recombination, and non-radiative recombination processes;physica status solidi (a);1985-07-16
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