Dynamic atomic force microscopy operation based on high flexure modes of the cantilever
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2348634
Reference25 articles.
1. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
2. High Resolution Images of Cell Surface Using a Tapping-Mode Atomic Force Microscope
3. Deformation, Contact Time, and Phase Contrast in Tapping Mode Scanning Force Microscopy
4. Energy dissipation in tapping-mode atomic force microscopy
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3. Flexural Vibration of an Atomic Force Microscope Cantilever Based on Modified Couple Stress Theory;International Journal of Structural Stability and Dynamics;2015-08-31
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