Auger mechanism of exoelectron emission in dielectrics with high electron affinity
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1608471
Reference36 articles.
1. Classification of Exoelectron Emission Mechanisms
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3. Analysis of Carrier Traps in Si3N4in Oxide/Nitride/Oxide for Metal/Oxide/Nitride/Oxide/Silicon Nonvolatile Memory
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