Muon implantation experiments in films: Obtaining depth-resolved information-Reference-Cited by-同舟云学术

Muon implantation experiments in films: Obtaining depth-resolved information

Published:2020-02-01 Issue:2 Volume:91 Page:023906
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Simões A. F. A.¹^ORCID,Alberto H. V.¹^ORCID,Vilão R. C.¹^ORCID,Gil J. M.¹^ORCID,Cunha J. M. V.²³⁴^ORCID,Curado M. A.¹²^ORCID,Salomé P. M. P.²⁴^ORCID,Prokscha T.⁵^ORCID,Suter A.⁵,Salman Z.⁵^ORCID

Affiliation:

1. CFisUC, Department of Physics, University of Coimbra, R. Larga, P-3004-516 Coimbra, Portugal

2. International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal

3. I3N, University of Aveiro, 3810-193 Aveiro, Portugal

4. Department of Physics, University of Aveiro, 3810-193 Aveiro, Portugal

5. Laboratory for Muon Spin Spectroscopy, Paul Scherrer Institute, CH-5232 Villigen PSI, Switzerland

Funder

Fundação para a Ciência e Tecnologia

European Regional Development Fund

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5126529

Reference27 articles.

1. ISIS muons for materials and molecular science studies

2. Muonium as a model for interstitial hydrogen in the semiconducting and semimetallic elements

3. Implantation studies of keV positive muons in thin metallic layers

4. Computer Simulation of Ion-Solid Interactions

5. Direct measurement of the London penetration depth inYBa2Cu3O6.92using low-energyμSR

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