New contactless method for lifetime measurement in semiconductor wafers-Reference-Cited by-同舟云学术

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New contactless method for lifetime measurement in semiconductor wafers

Published:1983-10 Issue:10 Volume:54 Page:1386-1391
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hlávka J.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1137251

Reference6 articles.

1. New principle of contactless lifetime determination in semiconductor wafers

2. Theory of the Photomagnetoelectric Effect in Semiconductors

3. Spot illumination of a semiconductor panel

4. Measurement of Minority Carrier Lifetime in Germanium

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Contactless photomagnetoelectric investigations of 2D semiconductors;Beilstein Journal of Nanotechnology;2018-10-25

2. Determination of Diffusion Length of Carriers in Graphene Using Contactless Photoelectromagnetic Method of Investigations;MRS Proceedings;2015

3. Photoelectromagnetic Investigations of Graphene;Acta Physica Polonica A;2014-11

4. Influence of acousto-optical modulation of laser radiation on the results of contactless photoelectromagnetic investigations;SPIE Proceedings;2003-10-06

5. Determining carrier lifetime using frequency dependence in contactless photoelectromagnetic investigations of semiconductors;Thin Solid Films;1995-10

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