Determination of crystallographic orientations in silicon films by Raman‐microprobe polarization measurements
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.342787
Reference17 articles.
1. Silicon graphoepitaxy using a strip‐heater oven
2. Growth of single‐crystal silicon islands on bulk fused silica by CO2laser annealing
3. Microanalysis of single‐crystal Si recrystallized using halogen lamps
4. Characterization and entrainment of subboundaries and defect trails in zone‐melting‐recrystallized Si films
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