Relation between current‐voltage characteristics and interface states at metal‐semiconductor interfaces
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.93777
Reference12 articles.
1. Are interface states consistent with Schottky barrier measurements?
2. Characterization of the interface states at a Ag/Si interface from capacitance measurements
3. Interface states in a cleaved metal‐silicon junction
4. Surface States and Rectification at a Metal Semi-Conductor Contact
5. Surface States and Barrier Height of Metal‐Semiconductor Systems
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