Measurement of the intrinsic signal‐to‐noise ratio for high‐performance rigid recording media-Reference-Cited by-同舟云学术

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Measurement of the intrinsic signal‐to‐noise ratio for high‐performance rigid recording media

Published:1986-01-15 Issue:2 Volume:59 Page:557-563
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Belk Nathan R.,George Peter K.,Mowry Greg S.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.336613

Reference23 articles.

1. Signal-to-noise limitations of particulate disc coatings

2. Effect of bitshift distribution on error rate in magnetic recording

3. Detection window and lineal density in digital recording systems

4. Code performance and head/Media interface

5. Measurement of noise in magnetic media

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1. Epitaxial growth of Sm(Co,Cu)5 thin film on Al2O3(0001) single-crystal substrate;Journal of Crystal Growth;2009-04

2. Effects of Co/Sm Composition on the Ordered Phase Formation in Sm-Co Thin Films Grown on Cu(111) Single-Crystal Underlayers;IEEE Transactions on Magnetics;2008-11

3. Percolation Studies in Synthetic Ferrimagnetic Recording Media;IEEE Transactions on Magnetics;2004-07

4. Extremely High-Density Longitudinal Magnetic Recording Media;Annual Review of Materials Science;2000-08

5. Magnetic thin films in recording technology;IBM Journal of Research and Development;2000-01

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