Study of critical optical confinement factor for GeSn-based multiple quantum well lasers

Author:

Abernathy Grey12,Ojo Solomon12,Grant Joshua M.1,Zhou Yiyin12,Du Wei13ORCID,Kuchuk Andrian4ORCID,Li Baohua5,Yu Shui-Qing14

Affiliation:

1. Department of Electrical Engineering, University of Arkansas, Fayetteville, Arkansas 72701, USA

2. Materials Science & Engineering Program, University of Arkansas, Fayetteville, Arkansas 72701, USA

3. Department of Electrical Engineering and Physics, Wilkes University, Wilkes Barre, Pennsylvania 18766, USA

4. Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville, Arkansas 72701, USA

5. Arktonics, LLC, 1339 South Pinnacle Drive, Fayetteville, Arkansas 72701, USA

Abstract

SiGeSn material is of great interest for the development of all-group-IV lasers on a Si substrate. While GeSn-based lasers have been reported worldwide, probing the fundamental limit to lase is highly desirable to reveal the material capability as a gain medium. In this work, three GeSn-based multiple quantum well lasers, with four wells, six wells, and ten wells, were characterized. The four-well device cannot achieve lasing due to the thin active region (thickness of 81 nm), resulting in insufficient optical confinement factor. With thicker active region, both six-well (92 nm) and ten-well (136 nm) devices show clear lasing output. The ten-well sample exhibits a higher lasing temperature of 90 K. The finding of this work reveals the fundamental limit of the required optical confinement factor to achieve lasing for a Fabry–Pérot cavity edge emitting laser devices.

Funder

Air Force Office of Scientific Research

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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