Self-scaling minority carrier lifetime imaging using periodically modulated electroluminescence
Author:
Affiliation:
1. Institute for Photovoltaics and Research Center SCoPE, University of Stuttgart, 70569 Stuttgart, Germany
Funder
Bundesministerium für Wirtschaft und Energie
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5003894
Reference15 articles.
1. Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera-based approach
2. Dynamic photoluminescence lifetime imaging of multicrystalline silicon bricks
3. Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging
4. Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
5. Determination of the effective diffusion length of silicon solar cells from photoluminescence
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