An environment-dependent semi-empirical tight binding model suitable for electron transport in bulk metals, metal alloys, metallic interfaces, and metallic nanostructures. I. Model and validation-Reference-Cited by-同舟云学术

An environment-dependent semi-empirical tight binding model suitable for electron transport in bulk metals, metal alloys, metallic interfaces, and metallic nanostructures. I. Model and validation

Published:2014-03-28 Issue:12 Volume:115 Page:123703
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Hegde Ganesh,Povolotskyi Michael,Kubis Tillmann,Boykin Timothy,Klimeck Gerhard

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4868977

Reference45 articles.

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4. The resistivity of thin metal films—Some critical remarks

5. Size-Dependent Resistivity in Nanoscale Interconnects

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