Detection of small-size solder ball defects through heat conduction analysis
Author:
Affiliation:
1. School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China
Funder
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5003674
Reference19 articles.
1. Defect characterisation using pulsed eddy current thermography under transmission mode and NDT applications
2. Investigation on high temperature mechanical fatigue failure behavior of SnAgCu/Cu solder joint
3. X. N. Lu, “Research on defects inspection of flip chip using active infrared thermography technology,” Master’s thesis (Huazhong University of Science and Technology, 2012).
4. X-ray digital microlaminography for BGA and flip-chip inspection
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