Electron microscope studies of an alloyed Au/Ni/Au‐Ge ohmic contact to GaAs
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.332011
Reference8 articles.
1. Metal-semiconductor contacts for GaAs bulk effect devices
2. Metallurgical and electrical characterization of metal-semiconductor contacts
3. Alloying behavior of Ni/Au‐Ge films on GaAs
4. Investigation of the AuGeNi system used for alloyed contacts to GaAs
5. The IBM computer-stem system
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