Photovoltage decay inp‐njunction solar cells including the effects of recombinations in the emitter
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.332257
Reference17 articles.
1. Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay
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3. On the Transient Behavior of Semiconductor Rectifiers
4. Measurement of Minority Carrier Lifetime and Surface Effects in Junction Devices
5. Mathematical formulation for the photo-induced open circuit voltage decay method for measurement of minority carrier lifetime in solar cells
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1. Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method;Solid-State Electronics;2013-03
2. Open-circuit voltage decay transient in dislocation-engineered Si p–n junction;Journal of Physics D: Applied Physics;2008-07-30
3. Field Passivation of the Silicon Wafer Rear Surface for Reliable Bulk Recombination Lifetime Measurement;Journal of The Electrochemical Society;2008
4. Open-circuit voltage decay in polycrystalline silicon solar cells;Solar Energy Materials and Solar Cells;1995-07
5. Applicability of electrical short circuit current decay for solar cell characterization: limits and comparison to other methods;Solar Energy Materials and Solar Cells;1995-03
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