Optical detection of misfit dislocation‐induced deep levels at InGaAs/GaAs heterojunctions
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.111201
Reference12 articles.
1. Interface trap and interface depletion in lattice-mismatched GaInAs/GaAs heterostructures
2. Interface trap and interface depletion in lattice-mismatched GaInAs/GaAs heterostructures
3. Electron-Energy-Loss Scattering near a Single Misfit Dislocation at the GaAs/GaInAs Interface
4. Electrical and structural study of partially relaxed Ga0.92In0.08As(p+)/ GaAs(n) diodes
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