X-ray nanotomography of SiO2-coated Pt90Ir10tips with sub-micron conducting apex-Reference-Cited by-同舟云学术

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X-ray nanotomography of SiO2-coated Pt90Ir10tips with sub-micron conducting apex

Published:2011-10-24 Issue:17 Volume:99 Page:173102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Rose V.¹,Chien T. Y.¹,Hiller J.²,Rosenmann D.³,Winarski R. P.³

Affiliation:

1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

2. Electron Microscopy Center, Argonne National Laboratory, Argonne, Illinois 60439, USA

3. Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3655907

Reference24 articles.

1. Nanoelectronics from the bottom up

3. M. Fichtner,Nanoscale Materials for Hydrogen and Energy Storage, Nanostructured Materials, edited by G. Wilde (Elsevier, Oxford, 2009), p. 270.

4. T. A. Jung, F. J. Himpsel, R. R. Schlittler, and J. K. Gimzewski,Chemical Information from Scanning Probe Microscopy and Spectroscopy, Scanning Probe Microscopy: Analytical Methods, edited by R. Wiesendanger (Springer, Berlin, 1998), p. 11.

5. V. Rose, J. W. Freeland, and S. K. Streiffer,New Capabilities on the Interface of X-rays and Scanning Tunneling Microscopy, Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy, edited by S. V. Kalinin and A. Gruverman (Springer, New York, 2011), p. 405.

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