Ambient-pressure atomic force microscope with variable pressure from ultra-high vacuum up to one bar-Reference-Cited by-同舟云学术

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Ambient-pressure atomic force microscope with variable pressure from ultra-high vacuum up to one bar

Published:2018-10 Issue:10 Volume:89 Page:103701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Choi Joong Il Jake¹²^ORCID,Kim Jeong Jin²^ORCID,Oh Wooseok¹²,Doh Won Hui²,Park Jeong Young¹²^ORCID

Affiliation:

1. Graduate School of EEWS and Department of Chemistry, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea

2. Center for Nanomaterials and Chemical Reactions, Institute for Basic Science, Daejeon 34141, South Korea

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5042076

Reference46 articles.

1. Atomic Force Microscope

2. Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

3. Force-distance curves by atomic force microscopy

4. Nanoscale adhesion between Pt nanoparticles and carbon support and its influence on the durability of fuel cells

5. Atomic scale friction and adhesion properties of quasicrystal surfaces

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