Note: Design of FPGA based system identification module with application to atomic force microscopy
Author:
Affiliation:
1. Seagate Technology, Shakopee, Minnesota 55379, USA
2. Engineering Development Group, Mathworks, Natick, Massachusetts 01760, USA
3. Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, USA
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5034016
Reference7 articles.
1. Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy
2. A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy
3. Toward quantitative estimation of material properties with dynamic mode atomic force microscopy: a comparative study
4. Real-time probe based quantitative determination of material properties at the nanoscale
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