Toward quantitative estimation of material properties with dynamic mode atomic force microscopy: a comparative study-Reference-Cited by-同舟云学术

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Toward quantitative estimation of material properties with dynamic mode atomic force microscopy: a comparative study

Published:2017-07-19 Issue:32 Volume:28 Page:325703
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Ghosal Sayan^ORCID,Gannepalli Anil,Salapaka Murti

Funder

CMMI - National Science Foundation, USA

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://iopscience.iop.org/article/10.1088/1361-6528/aa7079/pdf

Reference24 articles.

1. Imaging viscoelasticity by force modulation with the atomic force microscope

2. Imaging of lactic acid bacteria with AFM—elasticity and adhesion maps and their relationship to biological and structural data

3. Loss tangent imaging: Theory and simulations of repulsive-mode tapping atomic force microscopy

4. Real-time probe based quantitative determination of material properties at the nanoscale

5. Nanomechanical mapping of soft matter by bimodal force microscopy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Note: Design of FPGA based system identification module with application to atomic force microscopy;Review of Scientific Instruments;2018-05

2. Fidelity Measurement on Signal Detection Algorithms With Application to AFM Imaging;IEEE Access;2018

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