Correlation between x‐ray diffraction patterns and strain distribution inside GaInP/GaAs superlattices
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.112574
Reference8 articles.
1. Ultralow recombination velocity at Ga0.5In0.5P/GaAs heterointerfaces
2. Evidence for intrinsic interfacial strain in lattice-matchedInxGa1−xAs/InP heterostructures
3. Composition and lattice‐mismatch measurement of thin semiconductor layers by x‐ray diffraction
4. Investigation of the heteroepitaxial interfaces in the GaInP/GaAs superlattices by high‐resolution x‐ray diffractions and dynamical simulations
5. A Dynamical Theory of Diffraction for a Distorted Crystal
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