Photoluminescence study of interface defects in high‐quality GaAs‐GaAlAs superlattices
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.336476
Reference27 articles.
1. Optical characterization of interface disorder in multi-quantum well structures
2. Dependence of the structural and optical properties of GaAs‐Ga1−xAlxAs multiquantum‐well structures on growth temperature
3. Luminescence properties of GaAs‐Ga1−xAlxAs double heterostructures and multiquantum‐well superlattices grown by molecular beam epitaxy
4. Mobility Enhancement in Inverted AlxGa1-xAs/GaAs Modulation Doped Structures and Its Dependence on Donor-Electron Separation
5. Use of a superlattice to enhance the interface properties between two bulk heterolayers
Cited by 73 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Inter-valley phonon-assisted Auger recombination in InGaAs/InP quantum well;Journal of Applied Physics;2019-04-21
2. Effect of occupation of the excited states and phonon broadening on the determination of the hot carrier temperature from continuous wave photoluminescence in InGaAsP quantum well absorbers;Progress in Photovoltaics: Research and Applications;2017-04-17
3. Shallow-terrace-like interface in dilute-bismuth GaSb/AlGaSb single quantum wells evidenced by photoluminescence;Journal of Applied Physics;2013-04-21
4. Valence band tail states in disordered superlattices embedded in wide parabolic AlGaAs well;Journal of Applied Physics;2012-06-15
5. A comparative study of Al and LiF:Al interfaces with poly (3-hexylthiophene) using bias dependent photoluminescence technique;Organic Electronics;2008-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3